Mathematical methods of the calculation of the electronic devices’ reliability
Keywords:
electronic measuring instruments, metrological characteristics, probability density function, device’s reliability, intensity of the failuresSynopsis
The main questions of the theory of the measurement errors and probability theory were considered. The basic probability models of the parameters of the measuring instruments’ reliability and additional information materials were given.
Publication is intended for students of the specialties 171 «Electronics»,
175 «Information and Measuring Technologies» та 141 «Power Engineering, Electrical Engineering and Electromechanics».
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Published
January 24, 2025
Copyright (c) 2024 Shchapov P., Chunikhina T., Chmykhova O., National Technical University "Kharkiv Polytechnic Institute"
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This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.
Details about this monograph
ISBN-13 (15)
978-617-05-0523-1
